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固体表面、界面和薄膜（第5版）
作者：[德] 卢思 著
出版社：世界图书出版公司
出版时间：2014-07-01
ISBN：9787510077869
定价：¥99.00
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内容简介
From discussions with students working in the field of nanoelectronics and quantum effects in nanostructures I have leamed that many fundamental surface science concepts such as charging character of surface and interface states, Fernu-Ievel pinning have been forgotten over the years or not taught in an adequate way. Since these concepts are of paramount importance for research on semiconductor nanostructures Itried to deepen and extend these topics in the present edition.
作者简介
暂缺《固体表面、界面和薄膜（第5版）》作者简介
目录
1 Surface and Interface Physics: Its Definition and Importance
Panel Ⅰ: Ultrahigh Vacuum (UHV) Technology
Panel Ⅱ: Basics of Particle Optics and Spectroscopy
Problems
2 Preparation ofWell-Defined Surfaces,lnterfaces and Thin Films
2.1 Why Is Ultrahigh Vacuum Used?
2.2 Cleavage in UHV
2.3 Ion Bombardment and Annealing
2.4 Evaporation and Molecular Beam Epitaxy (MBE)
2.5 Epitaxy by Means of Chemical Reactions
Panel Ⅲ: Auger Electron Spectroscopy (AES)
Panel Ⅳ:Secondary Ion Mass Spectroscopy (SIMS)
Problems
3 Morphology and Structure ofSurfaces,lnterfaces and Thin Films
3.1 Surface Stress, Surface Energy, and Macroscopic Shape
3.2 Relaxation, Reconstruction, and Defects
3.3 Two-Dimensional Lattices, Superstructure, and Reciprocal Space
3.3.1 Surface Lattices and Superstructures
3.3.2 2D Reciprocal Lattice
3.4 Structural Models of Solid-Solid Interfaces
3.5 Nucleation and Growth of Thin Films
3.5.1 Modes of Film Growth
3.5.2 Capillary Model of Nucleation
3.6 Film-Growth Studies: Experimental Methods and Some Results
Panel V: Scanning Electron Microscopy (SEM) and Microprobe Techniques
Panel VI: Scanning Tunneling Microscopy (STM)
PaneI VII:Surface Extended X-Ray Absorption Fine Structur (SEXAFS)
Problems
……
4 Scattering from Surfaces and Thin Films
5 Surface Phonons
6 Electronic Surface States
7 Space-Charge Layers at Semiconductor Interfaces
8 Metal-Semiconductor Junctions and Semiconductor Heterostructures
9 Collective Phenomena at Interfaces: Superconductivity and Ferromagnetism
10 Adsorption on Solid Surfaces
References
Index
Panel Ⅰ: Ultrahigh Vacuum (UHV) Technology
Panel Ⅱ: Basics of Particle Optics and Spectroscopy
Problems
2 Preparation ofWell-Defined Surfaces,lnterfaces and Thin Films
2.1 Why Is Ultrahigh Vacuum Used?
2.2 Cleavage in UHV
2.3 Ion Bombardment and Annealing
2.4 Evaporation and Molecular Beam Epitaxy (MBE)
2.5 Epitaxy by Means of Chemical Reactions
Panel Ⅲ: Auger Electron Spectroscopy (AES)
Panel Ⅳ:Secondary Ion Mass Spectroscopy (SIMS)
Problems
3 Morphology and Structure ofSurfaces,lnterfaces and Thin Films
3.1 Surface Stress, Surface Energy, and Macroscopic Shape
3.2 Relaxation, Reconstruction, and Defects
3.3 Two-Dimensional Lattices, Superstructure, and Reciprocal Space
3.3.1 Surface Lattices and Superstructures
3.3.2 2D Reciprocal Lattice
3.4 Structural Models of Solid-Solid Interfaces
3.5 Nucleation and Growth of Thin Films
3.5.1 Modes of Film Growth
3.5.2 Capillary Model of Nucleation
3.6 Film-Growth Studies: Experimental Methods and Some Results
Panel V: Scanning Electron Microscopy (SEM) and Microprobe Techniques
Panel VI: Scanning Tunneling Microscopy (STM)
PaneI VII:Surface Extended X-Ray Absorption Fine Structur (SEXAFS)
Problems
……
4 Scattering from Surfaces and Thin Films
5 Surface Phonons
6 Electronic Surface States
7 Space-Charge Layers at Semiconductor Interfaces
8 Metal-Semiconductor Junctions and Semiconductor Heterostructures
9 Collective Phenomena at Interfaces: Superconductivity and Ferromagnetism
10 Adsorption on Solid Surfaces
References
Index
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